Diffraction Methods and Electron Microscopy

The banner image shows a LEEM image of a 0°-rotated monolayer graphene on a 6H-SiC(0001) substrate prepared via the surfactant-mediated growth method.

About

Diffraction methods provide quantitative structural information of periodic structures and are therefore complementary to scanning probe microscopies. We employ both, electron and x-ray diffraction, to study molecular and quantum materials. Our aberration-corrected electron spectromicroscope plays a special role here, as it combines nanometer-resolved microscopy with micro-diffraction and spectroscopic capabilities.

Research Topics

  • Aberration-corrected spectromicroscopy
  • Chemically-resolved vertical structures with sub-Angstrom resolution
  • Interfaces between molecules and crystalline phases
  • Epitaxial 2D materials

Contact

Prof. Dr. Christian Kumpf

PGI-3

Building 02.4w / Room 319

+49 2461/61-1452

E-Mail

Members

Hao YinPostdoc at Peter Grünberg Institute (PGI-3) Building 02.4w / Room 128+49 2461/61-6313
Monja StettnerPhD student at Peter Grünberg Institute (PGI-3) Building 02.4w / Room 128+49 2461/61-6313
Last Modified: 01.08.2025