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X-ray diffraction (XRD)

Method description:

XRD is a non destructive technique for the structural analysis of crystalline samples.

Basic prínciples:

XRD uses the effect that atoms (electrons) can scatter the incoming monochromatic X-rays resulting in a characteristic diffraction pattern due to Bragg’s law.

XRD can provide a qualitative and quantitative phase analysis, determination of the lattice parameters or residual stress, preferred orientation/texture and cystallite sizes.


The analysis will be performed by external collaborators. It is possible to use transmission as well as reflection set-ups.

Sample requirements:

Powders could be measured in transmission mode, solids or thin layers will be measured in reflection geometry.


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