http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Cao, L. (Corresponding author) ; Petracic, O. (Corresponding author) ; Zakalek, P. ; Weber, A. ; Rücker, U. ; Schubert, J. ; Koutsioumpas, A. ; Mattauch, S. ; Brückel, T.
Reversible Control of Physical Properties via an Oxygen-Vacancy-Driven Topotactic Transition in Epitaxial La 0.7 Sr 0.3 MnO 3− δ Thin Films
Advanced materials 31(7), 1806183 - (2019) [10.1002/adma.201806183]2019   Files BibTeX | EndNote: XML, Text | RIS

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Tryus, M. (Corresponding author) ; Nikolaev, K. V. ; Makhotkin, I. A. ; Schubert, J. ; Kibkalo, L. ; Danylyuk, S. ; Giglia, A. ; Nicolosi, P. ; Juschkin, L.
Optical and structural characterization of orthorhombic LaLuO3 using extreme ultraviolet reflectometry
Thin solid films 680, 94 - 101 (2019) [10.1016/j.tsf.2019.04.037]2019 BibTeX | EndNote: XML, Text | RIS

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Iken, H. ; Bronder, T. S. ; Goretzki, A. ; Kriesel, J. ; Ahlborn, K. ; Gerlach, F. ; Vonau, W. ; Zander, W. ; Schubert, J. ; Schöning, M. J. (Corresponding author)
Development of a Combined pH‐ and Redox‐Sensitive Bi‐Electrode Glass Thin‐Film Sensor
Physica status solidi / A Applied research A 216(12), 1900114 (2019) [10.1002/pssa.201900114]2019   Files BibTeX | EndNote: XML, Text | RIS

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Afanas'ev, V. V. (Corresponding author) ; Schubert, J. ; Neft, A. ; Delie, G. ; Shlyakhov, I. ; Trepalin, V. ; Houssa, M. ; Stesmans, A.
Determination of energy thresholds of electron excitations at semiconductor/insulator interfaces using trap-related displacement currents
Microelectronic engineering 215, 110992 - (2019) [10.1016/j.mee.2019.110992]2019   Files BibTeX | EndNote: XML, Text | RIS

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Han, Q. ; Aleksa, P. ; Tromm, T. C. U. ; Schubert, J. ; Mantl, S. ; Zhao, Q.-T. (Corresponding author)
Transient negative capacitance and charge trapping in FDSOI MOSFETs with ferroelectric HfYOX
Solid state electronics 159, 71 - 76 (2019) [10.1016/j.sse.2019.03.037]2019 BibTeX | EndNote: XML, Text | RIS

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Mei, A. B. (Corresponding author) ; Tang, Y. ; Schubert, J. ; Jena, D. ; Xing, H. ; Ralph, D. C. ; Schlom, D. G.
Self-assembly and properties of domain walls in BiFeO3 layers grown via molecular-beam epitaxy
APL materials 7(7), 071101 - (2019) [10.1063/1.5103244]2019   Files  Fulltext by OpenAccess repository BibTeX | EndNote: XML, Text | RIS