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Atomic Force Microscopy (AFM)

For thin film and substrate surface characterization, atomic force microscopy is an invaluable technique. We are equipped with an Agilent 5400 AFM/SPM, a versatile and easy-to-use scanning probe microscope which allows contact and non-contact AFM for measuring topographic information; electric force microscopy (EFM), magnetic force microscopy (MFM) and force modulation modes at room temperature and ambient conditions to gain insight into electrostatic force phenomena and magnetic domains at the sample surface. Scans are analyzed with the open-source software Gwyddion.

Atomic Force MicroscopyAFM at JCNS 2
Copyright: Forschungszentrum Jülich

Location: Geb. Nr. 4.8, Room No.: N 024A, Ph: 4259

Contact: 


Connie Bednarski-Meinke
Phone:   +49 2461 61-1941  
email:  c.bednarski-meinke@fz-juelich.de

ORCID

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