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Institute of Energy and Climate Research

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Microscopy and Tomography

For the investigation of microstructure – property relationships in electrochemical cells, novel ‘in-situ’ microscopy methods are developed and applied:

  • ‘in-situ’ electron microscopy (SEM, TEM) with chemical analysis
  • electrochemical atomic force microscopy (AFM)
  • laser-scanning microscopy
  • focused-ion beam (FIB) tomography
  • X-ray tomography

Furthermore, ‘post-test’ and ‘post-mortem’ investigations are performed.


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