link to homepage

Institute of Energy and Climate Research (IEK)

Navigation and service

High resolution transmission electron

The analytical electron microscopy is used for the investigation of microstructure and micro structural changes due to mechanical, thermal and/or chemical loading of materials. The laboratory is equipped with an analytical transmission electron microscope (TEM) Zeiss Libra 200 Cs combined with an objective-Cs-corrector achieving a resolution of < 90 pm. Besides the standard imaging and diffraction techniques CBED and precession diffraction are applied for the investigation of crystal structures and crystal structure defects. EDX and EELS/ESI that are used via the in column energy filter (corrected Ω-Filter) are relevant techniques for the micro structural chemical analysis. Electron tomography is an additional investigation method for the 3D view of structural features.

3D-Presentation (FIB-tomography) of the distribution of Laves phase particles in a ferritic Cr-Stahl3D-Presentation (FIB-tomography) of the distribution of Laves phase particles in a ferritic Cr-Stahl

A laboratory for TEM specimen preparation for metallic and ceramic materials is part of the analytical electron microscopy. Methods like electro polishing and sandwich preparation for layered materials and powder suspension are standard techniques. Beside the conventional methods a Focused Ion Beam (FIB) dual beam equipment Zeiss Auriga is applied for TEM specimen preparation and for new methods of tomography. Three types of tomographic investigation by FIB are carried out: FIB-tomography (3D structural view), EBSD-tomography (3D crystallographic view) and und EDX-tomography (3D element distribution).

The laboratory for analytical electron microscopy is partner laboratory of the International Centre of Electron Microscopy for Materials Science at AGH  University of Science and Technology in Krakau, Poland. This Centre was established in October 2010 for the investigation of industrial materials and for industrial applications and fort he development of methods of electron microscopy.