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Research Interests

Dr. Karsten Tillmann

  • Quantitative structual characterisation of nanoscale quantum systems and lattice defects through image analysis, image processing and image simulation.
  • Computer image analysis and processing together with the development of custom software solutions.
  • Electron microscopy characterization of the morphology, local layer compositions and elastic strains of nanostructures by conventional, in-situ, and high-resolution transmission electron microscopy in tandem with computer image simulations and finite element calculations.