Skip to main content
Skip to navigation
Skip to footer
de
en
Peter Grünberg Institute (PGI)
Electronic Materials (PGI-7)
Research groups
Equipment
Publications
Career
About us
/
Publications
/
Highlight Publications
/
Reliability effects of lateral filament confinement by nano-scaling the oxide in memristive devices.gif
Reliability effects of lateral filament confinement by nano-scaling the oxide in memristive devices.gif
Size: 32.4 kB — Click to download full sized image
Last Modified: 11.02.2025
